{"dataType": "CVE_RECORD", "dataVersion": "5.2", "cveMetadata": {"cveId": "CVE-2026-68991", "assignerOrgId": "a8bfbd5c-5645-475e-a8f4-6c140c17bd29", "state": "PUBLISHED", "assignerShortName": "samsungsemiconductor", "dateReserved": "2026-08-03T06:35:58.536Z", "datePublished": "2026-11-05T02:40:30.369Z", "dateUpdated": "2026-11-05T02:40:30.369Z"}, "containers": {"cna": {"problemTypes": [{"descriptions": [{"lang": "en", "cweId": "CWE-787", "description": "CWE-787", "type": "CWE"}]}], "affected": [{"vendor": "Samsung Semiconductor", "product": "Exynos 1480", "versions": [{"status": "affected", "version": "0", "lessThan": "November 2026", "versionType": "date"}], "defaultStatus": "unaffected"}, {"vendor": "Samsung Semiconductor", "product": "Exynos 2400", "versions": [{"status": "affected", "version": "0", "lessThan": "November 2026", "versionType": "date"}], "defaultStatus": "unaffected"}], "descriptions": [{"lang": "en", "value": "In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.", "supportingMedia": [{"type": "text/html", "base64": false, "value": "<span style=\"background-color: rgb(255, 255, 255);\">In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition.</span>"}]}], "references": [{"url": "https://semiconductor.samsung.com/support/quality-support/product-security-updates/"}], "providerMetadata": {"orgId": "a8bfbd5c-5645-475e-a8f4-6c140c17bd29", "shortName": "samsungsemiconductor", "dateUpdated": "2026-11-05T02:40:30.369Z"}}}}

{}

{"affected": [{"affectedData": [{"defaultStatus": "unaffected", "product": "Exynos 1480", "vendor": "Samsung Semiconductor", "versions": [{"lessThan": "November 2026", "status": "affected", "version": "0", "versionType": "date"}]}, {"defaultStatus": "unaffected", "product": "Exynos 2400", "vendor": "Samsung Semiconductor", "versions": [{"lessThan": "November 2026", "status": "affected", "version": "0", "versionType": "date"}]}], "source": "a8bfbd5c-5645-475e-a8f4-6c140c17bd29"}], "cveTags": [], "descriptions": [{"lang": "en", "value": "In the Samsung Exynos ENN NeuralNetworks HAL, improper input validation during request processing can cause memory corruption and lead to a denial of service condition."}], "id": "CVE-2026-68991", "lastModified": "2026-11-05T03:17:31.520", "metrics": {}, "published": "2026-11-05T03:17:31.520", "references": [{"source": "a8bfbd5c-5645-475e-a8f4-6c140c17bd29", "url": "https://semiconductor.samsung.com/support/quality-support/product-security-updates/"}], "sourceIdentifier": "a8bfbd5c-5645-475e-a8f4-6c140c17bd29", "vulnStatus": "Received", "weaknesses": [{"description": [{"lang": "en", "value": "CWE-787"}], "source": "a8bfbd5c-5645-475e-a8f4-6c140c17bd29", "type": "Secondary"}]}

{}

{"created": "2026-11-05T04:15:05.067454+00:00", "title": "Memory Corruption via Improper Input Validation in Exynos ENN NeuralNetworks HAL Leading to Denial of Service", "updated": "2026-11-05T04:15:05.067459+00:00", "vendors": []}